Feb-20-2013
ABSTRACT: Frequency dependence of the dielectric response is studied for ferroelectric bilayer thin-film capacitors under a cyclic bias voltage. The approach used in this work enables probing strong dielectric nonlinearities at millisecond and microsecond time scales during polarization switching in thin films.
Continue reading at Electrical measurements of dielectric nonlinearities in ferroelectric bilayer thin films in the Journal of Applied Physics.