Feb-20-2013 ABSTRACT: Frequency dependence of the dielectric response is studied for ferroelectric bilayer thin-film capacitors under a cyclic bias voltage. The approach used in this work enables probing strong dielectric nonlinearities at millisecond and microsecond time scales during polarization switching in thin films.  Continue reading at Electrical measurements of dielectric nonlinearities in ferroelectric bilayer thin films in the Journal of Applied Physics….Continue Reading New article published in the Journal of Applied Physics

Apr-7-2012 Tara Drwenski received an NSF Graduate Research Fellowship. Congratulations!…Continue Reading Student Receives NSF Graduate Research Fellowship

Dec-2011 First working Pb(Zr,Ti)O3 thin film samples were made using our new rf-sputtering system…Continue Reading First working thin film samples were made using our new system

Dec-14-2011 ABSTRACT: We have developed a new approach to measure fast electrical signals during polarization switching in ferroelectric thin-film capacitors. This article describes a simple method for probing transient currents and voltages in a broad range of time scales from microseconds to hundreds of picoseconds.  Continue reading at Ultrafast electrical measurements of polarization dynamics in ferroelectric thin-film capacitors in the Review of Scientific…Continue Reading Paper Published in Review of Scientific Instrument

Sep-2-2011 rf-magnetron sputter guns in the new sputtering system were operated for the first time…Continue Reading New Sputtering System